Review



nb5000 dual focused ion beam scanning electron microscope (fib-sem  (Hitachi Ltd)


Bioz Verified Symbol Hitachi Ltd is a verified supplier
Bioz Manufacturer Symbol Hitachi Ltd manufactures this product  
  • Logo
  • About
  • News
  • Press Release
  • Team
  • Advisors
  • Partners
  • Contact
  • Bioz Stars
  • Bioz vStars
  • 90

    Structured Review

    Hitachi Ltd nb5000 dual focused ion beam scanning electron microscope (fib-sem
    Nb5000 Dual Focused Ion Beam Scanning Electron Microscope (Fib Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/nb5000+dual+focused+ion+beam+scanning+electron+microscope+(fib-sem/10__1038_slash_s41529___022___00279___5-241-12-11
    Average 90 stars, based on 1 article reviews
    nb5000 dual focused ion beam scanning electron microscope (fib-sem - by Bioz Stars, 2026-10
    90/100 stars

    Images

    Related Articles

    Microscopy:

    Article Title: Influence of young cement water on the corrosion of the International Simple Glass
    Article Snippet: .. Thin sections across the alteration layers of the monoliths were prepared using a Hitachi NB5000 dual focused ion beam scanning electron microscope (FIB-SEM). .. Monolith thin sections were examined using a cold field emission Hitachi HF-3300 high-resolution transmission electron microscope with an accelerating voltage of 300 keV at Oak Ridge National Laboratory, which has the capability to generate simultaneous secondary electron and STEM images.

    other:

    Article Title: Surface interfacial analysis of simulant high level nuclear waste glass dissolved in synthetic cement solutions
    Article Snippet: The alteration layers of the powder samples were prepared using a Hitachi NB5000 dual focused ion beam scanning electron microscope (FIB-SEM) and examined using a cold field emission Hitachi HF-3300 high-resolution transmission electron microscope with an accelerating voltage of 300 keV at Oak Ridge National Laboratory, which has the capability to generate simultaneous secondary electron and STEM images.

    Article Title: Role of Hydrogen and Nitrogen on the Surface Chemical Structure of Bioactive Amorphous Silicon Oxynitride Films
    Article Snippet: After fabrication, samples were sectioned using a Hitachi NB5000 dual-beam scanning electron microscope focused ion beam (SEM-FIB) onto Cu grids prior to imaging by TEM.

    Article Title: Anodes for sodium ion batteries based on tin-germanium-antimony alloys.
    Article Snippet: Behdokht Farbod, Kai Cui, W. Peter Kalisvaart,* Martin Kupsta, Beniamin Zahiri, Alireza Kohandehghan, Elmira Memarzadeh Lotfabad, Zhi Li, Erik J. Luber, and David Mitlin* Department of Chemical and Materials Engineering, University of Alberta, 9107 116th Street, Edmonton, Alberta, T6G 2V4, Canada, National Institute for Nanotechnology (NINT), NRC, 11421 Saskatchewan Drive, Edmonton, Alberta, T6G 2M9, Canada, and Department of Chemistry, University of Alberta, Edmonton, Alberta, T6G 2G2, Canada,



    Similar Products

    90
    Hitachi Ltd nb5000 dual focused ion beam scanning electron microscope (fib-sem
    Nb5000 Dual Focused Ion Beam Scanning Electron Microscope (Fib Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/nb5000+dual+focused+ion+beam+scanning+electron+microscope+(fib-sem/10__1038_slash_s41529___022___00279___5-241-12-11
    Average 90 stars, based on 1 article reviews
    nb5000 dual focused ion beam scanning electron microscope (fib-sem - by Bioz Stars, 2026-10
    90/100 stars
      Buy from Supplier

    90
    Hitachi Ltd nb5000 dual-beam scanning electron microscope focused ion beam (sem-fib
    Nb5000 Dual Beam Scanning Electron Microscope Focused Ion Beam (Sem Fib, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/nb5000+dual+focused+ion+beam+scanning+electron+microscope+(fib-sem/pmc06542473-106-8-7
    Average 90 stars, based on 1 article reviews
    nb5000 dual-beam scanning electron microscope focused ion beam (sem-fib - by Bioz Stars, 2026-10
    90/100 stars
      Buy from Supplier

    90
    Hitachi Ltd nb5000 dual-beam focused ion beam/scanning electron microscope (fib/sem
    Nb5000 Dual Beam Focused Ion Beam/Scanning Electron Microscope (Fib/Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/nb5000+dual+focused+ion+beam+scanning+electron+microscope+(fib-sem/pm24735277-281-10-9
    Average 90 stars, based on 1 article reviews
    nb5000 dual-beam focused ion beam/scanning electron microscope (fib/sem - by Bioz Stars, 2026-10
    90/100 stars
      Buy from Supplier

    Image Search Results